Software defect prediction using static code metrics underestimates defect-proneness

David Gray, David Bowes, Neil Davey, Yi Sun, Bruce Christianson. Software defect prediction using static code metrics underestimates defect-proneness. In International Joint Conference on Neural Networks, IJCNN 2010, Barcelona, Spain, 18-23 July, 2010. pages 1-7, IEEE, 2010. [doi]

Abstract

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