Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network

Carl Edward Gray, Odile Liboiron-Ladouceur, David C. Keezer, Keren Bergman. Co-development of test electronics and PCI Express interface for a multi-Gbps optical switching network. In Jill Sibert, Janusz Rajski, editors, 2007 IEEE International Test Conference, ITC 2007, Santa Clara, California, USA, October 21-26, 2007. pages 1-9, IEEE, 2007. [doi]

Abstract

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