Methodologies and Algorithms for Testing Switch-Based NoC Interconnects

Cristian Grecu, Partha Pratim Pande, Baosheng Wang, André Ivanov, Res Saleh. Methodologies and Algorithms for Testing Switch-Based NoC Interconnects. In 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 3-5 October 2005, Monterey, CA, USA. pages 238-246, IEEE Computer Society, 2005. [doi]

Abstract

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