David A. Greene. Benefits of Boundary-Scan to In-Circuit Test. In Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993. pages 263, IEEE Computer Society, 1993.
@inproceedings{Greene93, title = {Benefits of Boundary-Scan to In-Circuit Test}, author = {David A. Greene}, year = {1993}, tags = {testing}, researchr = {https://researchr.org/publication/Greene93}, cites = {0}, citedby = {0}, pages = {263}, booktitle = {Proceedings IEEE International Test Conference 1993, Designing, Testing, and Diagnostics - Join Them, Baltimore, Maryland, USA, October 17-21, 1993}, publisher = {IEEE Computer Society}, isbn = {0-7803-1430-1}, }