Steven J. Greenwald. High Assurance Digital Forensics: A Panelist s Perspective. In Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2009, Berkeley, California, USA, May 21, 2009. pages 54-61, IEEE Computer Society, 2009. [doi]
@inproceedings{Greenwald09,
title = {High Assurance Digital Forensics: A Panelist s Perspective},
author = {Steven J. Greenwald},
year = {2009},
doi = {10.1109/SADFE.2009.17},
url = {http://doi.ieeecomputersociety.org/10.1109/SADFE.2009.17},
researchr = {https://researchr.org/publication/Greenwald09},
cites = {0},
citedby = {0},
pages = {54-61},
booktitle = {Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2009, Berkeley, California, USA, May 21, 2009},
publisher = {IEEE Computer Society},
isbn = {978-0-7695-3792-4},
}