High Assurance Digital Forensics: A Panelist s Perspective

Steven J. Greenwald. High Assurance Digital Forensics: A Panelist s Perspective. In Fourth International IEEE Workshop on Systematic Approaches to Digital Forensic Engineering, SADFE 2009, Berkeley, California, USA, May 21, 2009. pages 54-61, IEEE Computer Society, 2009. [doi]

Abstract

Abstract is missing.