M. S. Greeshma, V. R. Bindu. Novel Quality Metric for Image Super Resolution Algorithms - Super Resolution Entropy Metric (SREM). In K. C. Santosh, Ravindra S. Hegadi, editors, Recent Trends in Image Processing and Pattern Recognition - Second International Conference, RTIP2R 2018, Solapur, India, December 21-22, 2018, Revised Selected Papers, Part I. Volume 1035 of Communications in Computer and Information Science, pages 151-168, Springer, 2018. [doi]
Abstract is missing.