Carrier Thermal Conductivity: Analysis and Application to Submicron-Device Simulation

Alain Greiner, L. Varani, Luca Reggiani, Maria Cristina Vecchi, T. Kuhn, P. Golinelli. Carrier Thermal Conductivity: Analysis and Application to Submicron-Device Simulation. VLSI Design, 1998(1):59-64, 1998. [doi]

Abstract

Abstract is missing.