Pieter van de Griend, Rob J. Kusters, Jos J. M. Trienekens. Towards Log-Driven Monitoring of Technical Degradation: An ERP Perspective. In Boris Shishkov, editor, Business Modeling and Software Design - 13th International Symposium, BMSD 2023, Utrecht, The Netherlands, July 3-5, 2023, Proceedings. Volume 483 of Lecture Notes in Business Information Processing, pages 330-339, Springer, 2023. [doi]
Abstract is missing.