The UK5000 - successful collaborative development of an integrated design system for a 5000 gate CMOS array with built-in test

J. R. Grierson, B. Cosgrove, Daniel Richert, R. E. Halliwell, Harold Kirk, John C. Knight, John A. McLean, J. M. McGrail, C. O. Newton. The UK5000 - successful collaborative development of an integrated design system for a 5000 gate CMOS array with built-in test. In Charles E. Radke, editor, Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983. pages 629-636, ACM/IEEE, 1983. [doi]

@inproceedings{GriersonCRHKKMMN83,
  title = {The UK5000 - successful collaborative development of an integrated design system for a 5000 gate CMOS array with built-in test},
  author = {J. R. Grierson and B. Cosgrove and Daniel Richert and R. E. Halliwell and Harold Kirk and John C. Knight and John A. McLean and J. M. McGrail and C. O. Newton},
  year = {1983},
  url = {http://dl.acm.org/citation.cfm?id=800736},
  researchr = {https://researchr.org/publication/GriersonCRHKKMMN83},
  cites = {0},
  citedby = {0},
  pages = {629-636},
  booktitle = {Proceedings of the 20th Design Automation Conference, DAC '83, Miami Beach, Florida, USA, June 27-29, 1983},
  editor = {Charles E. Radke},
  publisher = {ACM/IEEE},
  isbn = {0-8186-0026-8},
}