Wesley Grignani, Douglas A. dos Santos, Carolina Imianosky, Douglas R. Melo, Frédéric Wrobel, Luigi Dilillo. Characterization of a Fault-Tolerant RISC-V SoC in an SRAM-based FPGA Under Proton Irradiation. In 27th IEEE Latin American Test Symposium, LATS 2026, Florianópolis, Brazil, March 17-20, 2026. pages 1-6, IEEE, 2026. [doi]
Abstract is missing.