Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer. REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen. In 17th IEEE VLSI Test Symposium (VTS 99), 25-30 April 1999, San Diego, CA, USA. pages 268-274, IEEE Computer Society, 1999. [doi]
Abstract is missing.