Full-chip analysis of unintentional forward biased diodes

Amir Grinshpon, Adam Segoli Schubert, Ziyang Lu. Full-chip analysis of unintentional forward biased diodes. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 62-66, IEEE, 2011. [doi]

@inproceedings{GrinshponSL11,
  title = {Full-chip analysis of unintentional forward biased diodes},
  author = {Amir Grinshpon and Adam Segoli Schubert and Ziyang Lu},
  year = {2011},
  doi = {10.1109/ISQED.2011.5770704},
  url = {http://dx.doi.org/10.1109/ISQED.2011.5770704},
  tags = {analysis},
  researchr = {https://researchr.org/publication/GrinshponSL11},
  cites = {0},
  citedby = {0},
  pages = {62-66},
  booktitle = {Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011},
  publisher = {IEEE},
  isbn = {978-1-61284-914-0},
}