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Cause Reduction for Quick Testing

Alex Groce, Mohammad Amin Alipour, Chaoqiang Zhang, Yang Chen, John Regehr. Cause Reduction for Quick Testing. In IEEE Seventh International Conference on Software Testing, Verification and Validation, ICST 2014, March 31 2014-April 4, 2014, Cleveland, Ohio, USA. pages 243-252, IEEE, 2014. [doi]

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