Control of the electromagnetic compatibility: An issue for IC reliability

Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot. Control of the electromagnetic compatibility: An issue for IC reliability. Microelectronics Reliability, 51(9-11):1493-1497, 2011. [doi]

Authors

Jean-Baptiste Gros

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Geneviève Duchamp

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Jean-Luc Levant

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Christian Marot

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