Jean-Baptiste Gros, Geneviève Duchamp, Jean-Luc Levant, Christian Marot. Control of the electromagnetic compatibility: An issue for IC reliability. Microelectronics Reliability, 51(9-11):1493-1497, 2011. [doi]
@article{GrosDLM11,
title = {Control of the electromagnetic compatibility: An issue for IC reliability},
author = {Jean-Baptiste Gros and Geneviève Duchamp and Jean-Luc Levant and Christian Marot},
year = {2011},
doi = {10.1016/j.microrel.2011.07.053},
url = {http://dx.doi.org/10.1016/j.microrel.2011.07.053},
researchr = {https://researchr.org/publication/GrosDLM11},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {51},
number = {9-11},
pages = {1493-1497},
}