Researchr is a web site for finding, collecting, sharing, and reviewing scientific publications, for researchers by researchers.
Sign up for an account to create a profile with publication list, tag and review your related work, and share bibliographies with your co-authors.
Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant. Electromagnetic immunity model of an ADC for microcontroller s reliability improvement. Microelectronics Reliability, 49(9-11):963-966, 2009. [doi]