Jean-Baptiste Gros, Geneviève Duchamp, Alain Meresse, Jean-Luc Levant. Electromagnetic immunity model of an ADC for microcontroller s reliability improvement. Microelectronics Reliability, 49(9-11):963-966, 2009. [doi]
@article{GrosDML09,
title = {Electromagnetic immunity model of an ADC for microcontroller s reliability improvement},
author = {Jean-Baptiste Gros and Geneviève Duchamp and Alain Meresse and Jean-Luc Levant},
year = {2009},
doi = {10.1016/j.microrel.2009.06.013},
url = {http://dx.doi.org/10.1016/j.microrel.2009.06.013},
tags = {reliability},
researchr = {https://researchr.org/publication/GrosDML09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {963-966},
}