R. Grover, T. Acosta, C. AnDyke, E. Armagan, C. Auth, S. Chugh, K. Downes, M. Hattendorf, N. Jack, S. Joshi, R. Kasim, Gerald S. Leatherman, S.-H. Lee, C. Y. Lin, A. Madhavan, H. Mao, A. Lowrie, G. Martin, G. McPherson, P. Nayak, A. Neale, D. Nminibapiel, B. Orr, J. Palmer, C. M. Pelto, S. S. Poon, I. Post, T. Pramanik, A. Rahman, S. Ramey, N. Seifert, K. Sethi, Anthony Schmitz, H. Wu, A. Yeoh. A Reliability Overview of Intel's 10+ Logic Technology. In 2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020. pages 1-6, IEEE, 2020. [doi]
@inproceedings{GroverAAAACDHJJ20,
title = {A Reliability Overview of Intel's 10+ Logic Technology},
author = {R. Grover and T. Acosta and C. AnDyke and E. Armagan and C. Auth and S. Chugh and K. Downes and M. Hattendorf and N. Jack and S. Joshi and R. Kasim and Gerald S. Leatherman and S.-H. Lee and C. Y. Lin and A. Madhavan and H. Mao and A. Lowrie and G. Martin and G. McPherson and P. Nayak and A. Neale and D. Nminibapiel and B. Orr and J. Palmer and C. M. Pelto and S. S. Poon and I. Post and T. Pramanik and A. Rahman and S. Ramey and N. Seifert and K. Sethi and Anthony Schmitz and H. Wu and A. Yeoh},
year = {2020},
doi = {10.1109/IRPS45951.2020.9128345},
url = {https://doi.org/10.1109/IRPS45951.2020.9128345},
researchr = {https://researchr.org/publication/GroverAAAACDHJJ20},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {2020 IEEE International Reliability Physics Symposium, IRPS 2020, Dallas, TX, USA, April 28 - May 30, 2020},
publisher = {IEEE},
isbn = {978-1-7281-3199-3},
}