Xinli Gu. RT level testability-driven partitioning. In 13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA. pages 176-183, IEEE Computer Society, 1995. [doi]
@inproceedings{Gu95:0,
title = {RT level testability-driven partitioning},
author = {Xinli Gu},
year = {1995},
url = {http://csdl.computer.org/comp/proceedings/vts/1995/7000/00/70000176abs.htm},
tags = {testing, partitioning},
researchr = {https://researchr.org/publication/Gu95%3A0},
cites = {0},
citedby = {0},
pages = {176-183},
booktitle = {13th IEEE VLSI Test Symposium (VTS 95), April 30 - May 3, 1995, Princeton, New Jersey, USA},
publisher = {IEEE Computer Society},
}