Jie Gu, Donald Barker, Michael G. Pecht. Uncertainty Assessment of Prognostics of Electronics Subject to Random Vibration. In George J. Vachtsevanos, N. Serdar Uckun, Kai Goebel, editors, Artificial Intelligence for Prognostics, Papers from the 2007 AAAI Fall Symposium, Arlington, Virginia, USA, November 9-11, 2007. Volume FS-07-02 of AAAI Technical Report, pages 50-57, AAAI Press, 2007. [doi]
Abstract is missing.