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Reusing debugging knowledge via trace-based bug search

Zhongxian Gu, Earl T. Barr, Drew Schleck, Zhendong Su. Reusing debugging knowledge via trace-based bug search. In Gary T. Leavens, Matthew B. Dwyer, editors, Proceedings of the 27th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2012, part of SPLASH 2012, Tucson, AZ, USA, October 21-25, 2012. pages 927-942, ACM, 2012. [doi]

Authors

Zhongxian Gu

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Earl T. Barr

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Drew Schleck

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Zhendong Su

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