Reusing debugging knowledge via trace-based bug search

Zhongxian Gu, Earl T. Barr, Drew Schleck, Zhendong Su. Reusing debugging knowledge via trace-based bug search. In Gary T. Leavens, Matthew B. Dwyer, editors, Proceedings of the 27th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2012, part of SPLASH 2012, Tucson, AZ, USA, October 21-25, 2012. pages 927-942, ACM, 2012. [doi]

@inproceedings{GuBSS12,
  title = {Reusing debugging knowledge via trace-based bug search},
  author = {Zhongxian Gu and Earl T. Barr and Drew Schleck and Zhendong Su},
  year = {2012},
  doi = {10.1145/2384616.2384684},
  url = {http://doi.acm.org/10.1145/2384616.2384684},
  researchr = {https://researchr.org/publication/GuBSS12},
  cites = {0},
  citedby = {0},
  pages = {927-942},
  booktitle = {Proceedings of the 27th Annual ACM SIGPLAN Conference on Object-Oriented Programming, Systems, Languages, and Applications, OOPSLA 2012, part of SPLASH 2012, Tucson, AZ, USA, October 21-25, 2012},
  editor = {Gary T. Leavens and Matthew B. Dwyer},
  publisher = {ACM},
  isbn = {978-1-4503-1561-6},
}