Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform

Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri. Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform. IEEE T. Instrumentation and Measurement, 65(4):890-897, 2016. [doi]

@article{GuHFL16,
  title = {Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform},
  author = {Sijia Gu and Kamel Haddadi and Abdelhatif El Fellahi and Tuami Lasri},
  year = {2016},
  doi = {10.1109/TIM.2015.2507699},
  url = {http://dx.doi.org/10.1109/TIM.2015.2507699},
  researchr = {https://researchr.org/publication/GuHFL16},
  cites = {0},
  citedby = {0},
  journal = {IEEE T. Instrumentation and Measurement},
  volume = {65},
  number = {4},
  pages = {890-897},
}