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Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform

Sijia Gu, Kamel Haddadi, Abdelhatif El Fellahi, Tuami Lasri. Setting Parameters Influence on Accuracy and Stability of Near-Field Scanning Microwave Microscopy Platform. IEEE T. Instrumentation and Measurement, 65(4):890-897, 2016. [doi]

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