Experimental analysis of Sn-3.0Ag-0.5Cu solder joint board-level drop/vibration impact failure models after thermal/isothermal cycling

Jian Gu, Jian Lin, Yongping Lei, Hanguang Fu. Experimental analysis of Sn-3.0Ag-0.5Cu solder joint board-level drop/vibration impact failure models after thermal/isothermal cycling. Microelectronics Reliability, 80:29-36, 2018. [doi]

Authors

Jian Gu

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Jian Lin

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Yongping Lei

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Hanguang Fu

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