AIM 2019 Challenge on Image Extreme Super-Resolution: Methods and Results

Shuhang Gu, Hanwen Liu, Dan Zhu, Tangxin Xie, Xin Yang, Chen Zhu, Jia Yu, Wenyu Sun, Xin Tao, Zijun Deng, Liying Lu, Martin Danelljan, Wenbo Li, Taian Guo, Xiaoyong Shen, Xuemiao Xu, Yu-Wing Tai, Jiaya Jia, Peng Yi, Zhongyuan Wang, Kui Jiang, Junjun Jiang, Radu Timofte, Jiayi Ma 0001, Zhi-Song Liu, Li-wen Wang, Chu-Tak Li, Wan-Chi Siu, Yui-Lam Chan, Ruofan Zhou, Majed El Helou, Kuldeep Purohit, Praveen Kandula, Muhammad Haris, Maitreya Suin, Rajagopalan A. N, Kazutoshi Akita, Greg Shakhnarovic, Norimichi Ukita, Pablo Navarrete Michelini, Wenbin Chen. AIM 2019 Challenge on Image Extreme Super-Resolution: Methods and Results. In 2019 IEEE/CVF International Conference on Computer Vision Workshops, ICCV Workshops 2019, Seoul, Korea (South), October 27-28, 2019. pages 3556-3564, IEEE, 2019. [doi]

@inproceedings{GuLZXYZYSTDLDLG19,
  title = {AIM 2019 Challenge on Image Extreme Super-Resolution: Methods and Results},
  author = {Shuhang Gu and Hanwen Liu and Dan Zhu and Tangxin Xie and Xin Yang and Chen Zhu and Jia Yu and Wenyu Sun and Xin Tao and Zijun Deng and Liying Lu and Martin Danelljan and Wenbo Li and Taian Guo and Xiaoyong Shen and Xuemiao Xu and Yu-Wing Tai and Jiaya Jia and Peng Yi and Zhongyuan Wang and Kui Jiang and Junjun Jiang and Radu Timofte and Jiayi Ma 0001 and Zhi-Song Liu and Li-wen Wang and Chu-Tak Li and Wan-Chi Siu and Yui-Lam Chan and Ruofan Zhou and Majed El Helou and Kuldeep Purohit and Praveen Kandula and Muhammad Haris and Maitreya Suin and Rajagopalan A. N and Kazutoshi Akita and Greg Shakhnarovic and Norimichi Ukita and Pablo Navarrete Michelini and Wenbin Chen},
  year = {2019},
  doi = {10.1109/ICCVW.2019.00440},
  url = {https://doi.org/10.1109/ICCVW.2019.00440},
  researchr = {https://researchr.org/publication/GuLZXYZYSTDLDLG19},
  cites = {0},
  citedby = {0},
  pages = {3556-3564},
  booktitle = {2019 IEEE/CVF International Conference on Computer Vision Workshops, ICCV Workshops 2019, Seoul, Korea (South), October 27-28, 2019},
  publisher = {IEEE},
  isbn = {978-1-7281-5023-9},
}