JGRE: An Analysis of JNI Global Reference Exhaustion Vulnerabilities in Android

Yacong Gu, Kun Sun, Purui Su, Qi Li, Yemian Lu, Lingyun Ying, Dengguo Feng. JGRE: An Analysis of JNI Global Reference Exhaustion Vulnerabilities in Android. In 47th Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2017, Denver, CO, USA, June 26-29, 2017. pages 427-438, IEEE Computer Society, 2017. [doi]

Abstract

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