Yunfei Gu, Xingyu Wang, Zixiao Chen, Chentao Wu, Xinfei Guo, Jie Li, Minyi Guo, Song Wu, Rong Yuan, Taile Zhang, Yawen Zhang, Haoran Cai. Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction. In IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023. pages 226-235, IEEE, 2023. [doi]
@inproceedings{GuWCWGLGWYZZC23,
title = {Improving Productivity and Efficiency of SSD Manufacturing Self-Test Process by Learning-Based Proactive Defect Prediction},
author = {Yunfei Gu and Xingyu Wang and Zixiao Chen and Chentao Wu and Xinfei Guo and Jie Li and Minyi Guo and Song Wu and Rong Yuan and Taile Zhang and Yawen Zhang and Haoran Cai},
year = {2023},
doi = {10.1109/ITC51656.2023.00039},
url = {https://doi.org/10.1109/ITC51656.2023.00039},
researchr = {https://researchr.org/publication/GuWCWGLGWYZZC23},
cites = {0},
citedby = {0},
pages = {226-235},
booktitle = {IEEE International Test Conference, ITC 2023, Anaheim, CA, USA, October 7-15, 2023},
publisher = {IEEE},
isbn = {979-8-3503-4325-0},
}