A comparative study on electrothermal characteristics of nanoscale multiple gate MOSFETs

Qi-Lin Gu, Peng Zhang, Yi Ru, Hao Song, Wen-Sheng Zhao, Wen-Yan Yin. A comparative study on electrothermal characteristics of nanoscale multiple gate MOSFETs. Microelectronics Reliability, 78:362-369, 2017. [doi]

Abstract

Abstract is missing.