Defect Inspection using Gravitation Loss and Soft Labels - researchr publication authors

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Zhihao Guan, Zidong Guo, Jie Lyu 0001, Zejian Yuan. Defect Inspection using Gravitation Loss and Soft Labels. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 1184-1188, IEEE, 2021. [doi]

This author has not been identified. Look up 'Zhihao Guan' in GoogleThis author has not been identified. Look up 'Zidong Guo' in GoogleThis author has not been identified. Look up 'Jie Lyu 0001' in GoogleThis author has not been identified. Look up 'Zejian Yuan' in Google

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