Zhihao Guan, Zidong Guo, Jie Lyu 0001, Zejian Yuan. Defect Inspection using Gravitation Loss and Soft Labels. In 2021 IEEE International Conference on Image Processing, ICIP 2021, Anchorage, AK, USA, September 19-22, 2021. pages 1184-1188, IEEE, 2021. [doi]
Abstract is missing.