Statistical analysis of process variation induced SRAM electromigration degradation

Zhong Guan, Malgorzata Marek-Sadowska, Sani R. Nassif. Statistical analysis of process variation induced SRAM electromigration degradation. In Fifteenth International Symposium on Quality Electronic Design, ISQED 2014, Santa Clara, CA, USA, March 3-5, 2014. pages 700-707, IEEE, 2014. [doi]

Abstract

Abstract is missing.