Fabric Defect Detection Based on Wavelet Characteristics

Shengqi Guan, Xiuhua Shi, Haiying Cui, Yuqin Song. Fabric Defect Detection Based on Wavelet Characteristics. In PACIIA 2008, Volume 1, 2008 IEEE Pacific-Asia Workshop on Computational Intelligence and Industrial Application, 19-20 December 2008, Wuhan, China. pages 366-370, IEEE Computer Society, 2008. [doi]

Abstract

Abstract is missing.