Shouping Guan, Yuyong Wang, Xiangming Chen. An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument. IEEE T. Instrumentation and Measurement, 68(10):4122-4134, 2019. [doi]
@article{GuanWC19-0,
title = {An Approach of Single-Crystal Defect Detection Using X-Ray Orientation Instrument},
author = {Shouping Guan and Yuyong Wang and Xiangming Chen},
year = {2019},
doi = {10.1109/TIM.2018.2884017},
url = {https://doi.org/10.1109/TIM.2018.2884017},
researchr = {https://researchr.org/publication/GuanWC19-0},
cites = {0},
citedby = {0},
journal = {IEEE T. Instrumentation and Measurement},
volume = {68},
number = {10},
pages = {4122-4134},
}