Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification

Tong Guan, Zhaobo Zhang, Wen Dong 0001, Chunming Qiao, Xinli Gu. Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specification. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]

Authors

Tong Guan

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Zhaobo Zhang

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Wen Dong 0001

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Chunming Qiao

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Xinli Gu

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