Abstract is missing.
- Application-aware lifetime estimation of power devicesCiprian V. Pop, Corneliu Burileanu, Andi Buzo, Georg Pelz. 1-2 [doi]
- Integrated circuits' characterization for non-normal data in semiconductor quality analysisIngrid Kovacs, Marina Topa, Andi Buzo, Georg Pelz. 1-2 [doi]
- Improving the dependability of AMR sensors used in automotive applicationsAndreina Zambrano, Hans G. Kerkhoff. 1-2 [doi]
- SIC pair generation in optimal time using rotatable countersIoannis Voyiatzis. 1-2 [doi]
- Counteracting malicious faults in cryptographic circuitsIlia Polian, Francesco Regazzoni. 1-10 [doi]
- Automatic testing of analog ICs for latent defects using topology modificationNektar Xama, Anthony Coyette, Baris Esen, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. 1-6 [doi]
- Refresh frequency reduction of data stored in SSDs based on A-timer and timestampsMarcelino Seif, Emna Farjallah, Franck Badets, Emna Chabchoub, Christophe Layer, Jean-Marc Armani, Francis Joffre, Costin Anghel, Luigi Dilillo, Valentin Gherman. 1-6 [doi]
- Extended binary nonlinear codes and their application in testing and compressionOndrej Novák. 1-2 [doi]
- An efficient test technique to prevent scan-based side-channel attacksSatyadev Ahlawat, Darshit Vaghani, Virendra Singh. 1-2 [doi]
- ForewordMaria K. Michael, Rolf Drechsler, Stephan Eggersglüß, Haralampos-G. D. Stratigopoulos, Sybille Hellebrand, Rob Aitken. 1-2 [doi]
- Impact of the switching activity on the aging of delay-PUFsNaghmeh Karimi, Jean-Luc Danger, Mariem Slimani, Sylvain Guilley. 1-2 [doi]
- Detecting hardware Trojans without a Golden IC through clock-tree defined circuit partitionsFakir Sharif Hossain, Tomokazu Yoneda, Michiko Inoue, Alex Orailoglu. 1-6 [doi]
- 2) test algorithmsArtur Pogiel, Janusz Rajski, Jerzy Tyszer. 1-6 [doi]
- Probabilistic sensitization analysis for variation-aware path delay fault test evaluationMarcus Wagner, Hans-Joachim Wunderlich. 1-6 [doi]
- A very low cost and highly parallel DfT method for analog and mixed-signal circuitsBaris Esen, Anthony Coyette, Nektar Xama, Wim Dobbelaere, Ronny Vanhooren, Georges G. E. Gielen. 1-2 [doi]
- A phase locking test solution for MEMS devicesTareq Muhammad Supon, Rashid Rashidzadeh. 1-6 [doi]
- Low power probabilistic online monitoring of systematic erroneous behaviourMauricio D. Gutierrez, Vasileios Tenentes, Tom J. Kazmierski, Daniele Rossi. 1-2 [doi]
- Derivation of the reliability metric for digital circuitsMohamed A. Abufalgha, Alex Bystrov. 1-2 [doi]
- Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditionsAmit Karel, Florence Azaïs, Mariane Comte, Jean Marc Gallière, Michel Renovell, Keshav Singh. 1-2 [doi]
- Real-time self-learning for control law adaptation in nonlinear systems using encoded check statesSuvadeep Banerjee, Abhijit Chatterjee. 1-6 [doi]
- Volume diagnosis data miningWu-Tung Cheng, Yue Tian, Sudhakar M. Reddy. 1-10 [doi]
- Contact-less near-field measurement of RF phased array antenna mismatchesMaryam Shafiee, Sule Ozev. 1-6 [doi]
- A homogeneous framework for AMS languages instrumentation, abstraction and simulationEnrico Fraccaroli, Luca Piccolboni, Franco Fummi. 1-2 [doi]
- Coverage-driven mixed-signal verification of smart power ICs in a UVM environmentSebastian Simon, Deeksha Bhat, Alexander W. Rath, Jérôme Kirscher, Linus Maurer. 1-6 [doi]
- Periodic Bias-Temperature Instability monitoring in SRAM cellsYiorgos Tsiatouhas. 1-2 [doi]
- Online Profiling for cluster-specific variable rate refreshing in high-density DRAM systemsRasool Sharifi, Zainalabedin Navabi. 1-6 [doi]
- ISO26262-compliant soft-error mitigation in register banksJan Schat. 1-2 [doi]
- Rout3D: A lightweight adaptive routing algorithm for tolerating faulty vertical links in 3D-NoCsAmir Charif, Nacer-Eddine Zergainoh, Alexandre Coelho, Michael Nicolaidis. 1-6 [doi]
- Aging-aware coding scheme for memory arraysMohammad Saber Golanbari, Nour Sayed, Mojtaba Ebrahimi, Mohammad Hadi Moshrefpour Esfahany, Saman Kiamehr, Mehdi Baradaran Tahoori. 1-6 [doi]
- Scan chain encryption for the test, diagnosis and debug of secure circuitsMathieu Da Silva, Marie-Lise Flottes, Giorgio Di Natale, Bruno Rouzeyre, Paolo Prinetto, Marco Restifo. 1-6 [doi]
- Automated area and coverage optimization of minimal latency checkersSiavoosh Payandeh Azad, Behrad Niazmand, Apneet Kaur Sandhu, Jaan Raik, Gert Jervan, Thomas Hollstein. 1-2 [doi]
- Exploiting STT-MRAM for approximate computingNour Sayed, Fabian Oboril, Azadeh Shirvanian, Rajendra Bishnoi, Mehdi Baradaran Tahoori. 1-6 [doi]
- Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technologyHani Malloug, Manuel J. Barragan Asian, Salvador Mir, Laurent Basteres, Hervé Le Gall. 1-6 [doi]
- Mitigating read & write errors in STT-MRAM memories under DVSElena Ioana Vatajelu, Rosa Rodríguez-Montañés, Michel Renovell, Joan Figueras. 1-2 [doi]
- Extension of power supply impedance emulation method on ATE for multiple power domainNaoki Terao, Toru Nakura, Masahiro Ishida, Rimon Ikeno, Takashi Kusaka, Tetsuya Iizuka, Kunihiro Asada. 1-2 [doi]
- Data-driven fault diagnosis with missing syndromes imputation for functional test through conditional specificationTong Guan, Zhaobo Zhang, Wen Dong 0001, Chunming Qiao, Xinli Gu. 1-6 [doi]
- Specification and verification of security in reconfigurable scan networksMichael A. Kochte, Matthias Sauer, Laura Rodríguez Gómez, Pascal Raiola, Bernd Becker 0001, Hans-Joachim Wunderlich. 1-6 [doi]
- Multiple-defect diagnosis for Logic Characterization VehiclesBen Niewenhuis, Soumya Mittal, R. D. (Shawn) Blanton. 1-6 [doi]
- Bridge over troubled waters: Critical area based pattern generationPeter C. Maxwell, Friedrich Hapke, Maija Ryynaenen, Peter Weseloh. 1-6 [doi]
- A built-in self-test scheme for classifying refresh periods of DRAMsChia-Ming Chang, Yong-Xiao Chen, Jin-Fu Li. 1-2 [doi]
- Best paperBernd Becker 0001, Adit D. Singh. 1 [doi]
- Mixed-signal BIST computation offloading using IEEE 1687Michele Portolan, Manuel J. Barragan, Rshdee Alhakim, Salvador Mir. 1-2 [doi]
- Security and trust in the analog/mixed-signal/RF domain: A survey and a perspectiveAngelos Antonopoulos, Christiana Kapatsori, Yiorgos Makris. 1-10 [doi]