Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology

Hani Malloug, Manuel J. Barragan Asian, Salvador Mir, Laurent Basteres, Hervé Le Gall. Design of a sinusoidal signal generator with calibrated harmonic cancellation for mixed-signal BIST in a 28 nm FDSOI technology. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]

Abstract

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