Sebastian Simon, Deeksha Bhat, Alexander W. Rath, Jérôme Kirscher, Linus Maurer. Coverage-driven mixed-signal verification of smart power ICs in a UVM environment. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]
Abstract is missing.