Sebastian Simon, Deeksha Bhat, Alexander W. Rath, Jérôme Kirscher, Linus Maurer. Coverage-driven mixed-signal verification of smart power ICs in a UVM environment. In 22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017. pages 1-6, IEEE, 2017. [doi]
@inproceedings{SimonBRKM17, title = {Coverage-driven mixed-signal verification of smart power ICs in a UVM environment}, author = {Sebastian Simon and Deeksha Bhat and Alexander W. Rath and Jérôme Kirscher and Linus Maurer}, year = {2017}, doi = {10.1109/ETS.2017.7968237}, url = {https://doi.org/10.1109/ETS.2017.7968237}, researchr = {https://researchr.org/publication/SimonBRKM17}, cites = {0}, citedby = {0}, pages = {1-6}, booktitle = {22nd IEEE European Test Symposium, ETS 2017, Limassol, Cyprus, May 22-26, 2017}, publisher = {IEEE}, isbn = {978-1-5090-5457-2}, }