Valentin Guerlesquin. How (not) to remove technical debt in testing environments: six good way to fail. In Paris Avgeriou, Klaus Schmid, editors, Proceedings of the Second International Conference on Technical Debt, TechDebt@ICSE 2019, Montreal, QC, Canada, May 26-27, 2019. pages 1-2, IEEE / ACM, 2019. [doi]
@inproceedings{Guerlesquin19,
title = {How (not) to remove technical debt in testing environments: six good way to fail},
author = {Valentin Guerlesquin},
year = {2019},
url = {https://dl.acm.org/citation.cfm?id=3355323},
researchr = {https://researchr.org/publication/Guerlesquin19},
cites = {0},
citedby = {0},
pages = {1-2},
booktitle = {Proceedings of the Second International Conference on Technical Debt, TechDebt@ICSE 2019, Montreal, QC, Canada, May 26-27, 2019},
editor = {Paris Avgeriou and Klaus Schmid},
publisher = {IEEE / ACM},
}