Pablo Ezequiel Guerrero, Iliya Gurov, Alejandro P. Buchmann, Kristof Van Laerhoven. Diagnosing the weakest link in WSN testbeds: A reliability and cost analysis of the USB backchannel. In 37th Annual IEEE Conference on Local Computer Networks, Workshop Proceedings, Clearwater Beach, FL, USA, October 22-25, 2012. pages 934-942, IEEE, 2012. [doi]
Abstract is missing.