Giuseppe Di Guglielmo, Franco Fummi, Cristina Marconcini, Graziano Pravadelli. Improving Gate-Level ATPG by Traversing Concurrent EFSMs. In 24th IEEE VLSI Test Symposium (VTS 2006), 30 April - 4 May 2006, Berkeley, California, USA. pages 172-179, IEEE Computer Society, 2006. [doi]
Abstract is missing.