Oscar M. Guillen, Ralf Brederlow, Ralph Ledwa, Georg Sigl. Risk management in embedded devices using metering applications as example. In Ting Yu, Shengqi Yang, editors, Proceedings of the 9th Workshop on Embedded Systems Security, WESS '14, New Delhi, India, October 17, 2014. ACM, 2014. [doi]
Abstract is missing.