Fault modeling and testing of self-timed circuits

Stanford S. Guillory, Daniel G. Saab, Andrew T. Yang. Fault modeling and testing of self-timed circuits. In 9th IEEE VLSI Test Symposium (VTS'91), 15-17 Apr 1991, Atlantic City, NJ, USA. pages 62-66, IEEE, 1991. [doi]

Abstract

Abstract is missing.