Mario Vinicius Guimaraes, Frank Sill Torres. Automatic layout integration of Bulk Built-In Current Sensors for detection of soft errors. In 29th Symposium on Integrated Circuits and Systems Design, SBCCI 2016, Belo Horizonte, Brazil, August 29 - September 3, 2016. pages 1-6, IEEE, 2016. [doi]
@inproceedings{GuimaraesT16,
title = {Automatic layout integration of Bulk Built-In Current Sensors for detection of soft errors},
author = {Mario Vinicius Guimaraes and Frank Sill Torres},
year = {2016},
doi = {10.1109/SBCCI.2016.7724073},
url = {http://dx.doi.org/10.1109/SBCCI.2016.7724073},
researchr = {https://researchr.org/publication/GuimaraesT16},
cites = {0},
citedby = {0},
pages = {1-6},
booktitle = {29th Symposium on Integrated Circuits and Systems Design, SBCCI 2016, Belo Horizonte, Brazil, August 29 - September 3, 2016},
publisher = {IEEE},
isbn = {978-1-5090-2736-1},
}