ATPG power guards: On limiting the test power below threshold

Rohini Gulve, Virendra Singh. ATPG power guards: On limiting the test power below threshold. In 2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018. pages 301-304, IEEE, 2018. [doi]

@inproceedings{GulveS18,
  title = {ATPG power guards: On limiting the test power below threshold},
  author = {Rohini Gulve and Virendra Singh},
  year = {2018},
  doi = {10.23919/DATE.2018.8342025},
  url = {https://doi.org/10.23919/DATE.2018.8342025},
  researchr = {https://researchr.org/publication/GulveS18},
  cites = {0},
  citedby = {0},
  pages = {301-304},
  booktitle = {2018 Design, Automation & Test in Europe Conference & Exhibition, DATE 2018, Dresden, Germany, March 19-23, 2018},
  publisher = {IEEE},
  isbn = {978-3-9819263-0-9},
}