Qi Guo, Tianshi Chen, Haihua Shen, Yunji Chen, Yue Wu, Weiwu Hu. Empirical design bugs prediction for verification. In Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011. pages 161-166, IEEE, 2011. [doi]
@inproceedings{GuoCSCWH11,
title = {Empirical design bugs prediction for verification},
author = {Qi Guo and Tianshi Chen and Haihua Shen and Yunji Chen and Yue Wu and Weiwu Hu},
year = {2011},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763036},
researchr = {https://researchr.org/publication/GuoCSCWH11},
cites = {0},
citedby = {0},
pages = {161-166},
booktitle = {Design, Automation and Test in Europe, DATE 2011, Grenoble, France, March 14-18, 2011},
publisher = {IEEE},
isbn = {978-1-61284-208-0},
}