Jierong Guo, Yigang He, Meirong Liu. Wavelet Neural Network Approach for Testing of Switched-Current Circuits. J. Electronic Testing, 27(5):611-625, 2011. [doi]
@article{GuoHL11-1,
title = {Wavelet Neural Network Approach for Testing of Switched-Current Circuits},
author = {Jierong Guo and Yigang He and Meirong Liu},
year = {2011},
doi = {10.1007/s10836-011-5248-1},
url = {http://dx.doi.org/10.1007/s10836-011-5248-1},
researchr = {https://researchr.org/publication/GuoHL11-1},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {27},
number = {5},
pages = {611-625},
}