Effect of Microgeometry on Modeling Accuracy of Fluid-Saturated Rock Using Dielectric Permittivity

Chen Guo 0002, Bowen Ling, Gary Mavko, Richard C. Liu. Effect of Microgeometry on Modeling Accuracy of Fluid-Saturated Rock Using Dielectric Permittivity. IEEE T. Geoscience and Remote Sensing, 57(9):7294-7299, 2019. [doi]

Authors

Chen Guo 0002

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Bowen Ling

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Gary Mavko

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Richard C. Liu

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